- secondary ion yield
- выход вторичных ионов
Англо-український і українсько-англійський словник з аналітичної хімії. — Севастополь: «Вебер». В.В. Рафалюк, О.М. Ловягін . 2002.
secondary ion yield
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Secondary ion mass spectrometry — Infobox chemical analysis name = Secondary ion mass spectrometry caption =CAMECA IMS3f Magnetic SIMS Instrument acronym = SIMS classification =Mass spectrometry analytes = Solid surfaces, thin films related = Fast atom bombardment… … Wikipedia
Static secondary ion mass spectrometry — Static secondary ion mass spectrometry, or static SIMS is a technique for chemical analysis including elemental composition and chemical structure of the uppermost atomic or molecular layer of a solid which may be a metal, semiconductor or… … Wikipedia
Secondary emission — is a phenomenon where additional electrons, called secondary electrons, are emitted from the surface of a material when an incident particle (often, charged particle such as electron or ion) impacts the material with sufficient energy. The number … Wikipedia
ion-exchange reaction — ▪ chemical reaction Introduction any of a class of chemical reactions between two substances (each consisting of positively and negatively charged species called ions (ion)) that involves an exchange of one or more ionic components.… … Universalium
Sensitive high resolution ion microprobe — The sensitive high resolution ion microprobe (SHRIMP) is a large diameter, double focusing secondary ion mass spectrometer (SIMS). The SHRIMP is primarily used for geological and geochemical applications. It can rapidly measure the isotopic and… … Wikipedia
Scanning Helium Ion Microscope — A Scanning Helium Ion Microscope (SHIM) is a new imaging technology based on a scanning helium ion beam. [ [http://nanotechwire.com/news.asp?nid=2120 ntid=121 pg=1 Nanotechwire press release announcing new microscope, retrieved December 13, 2006] … Wikipedia
surface analysis — ▪ chemistry Introduction in analytical chemistry (chemistry), the study of that part of a solid that is in contact with a gas or a vacuum. When two phases of matter are in contact, they form an interface. The term surface is usually… … Universalium
spectroscopy — spectroscopist /spek tros keuh pist/, n. /spek tros keuh pee, spek treuh skoh pee/, n. the science that deals with the use of the spectroscope and with spectrum analysis. [1865 70; SPECTRO + SCOPY] * * * Branch of analysis devoted to identifying… … Universalium
Auger electron spectroscopy — (AES; Auger pronounced|oːʒeː in French) is a common analytical technique used specifically in the study of surfaces and, more generally, in the area of materials science. Underlying the spectroscopic technique is the Auger effect, as it has come… … Wikipedia
mass spectrometry — or mass spectroscopy Analytic technique by which chemical substances are identified by sorting gaseous ions by mass using electric and magnetic fields. A mass spectrometer uses electrical means to detect the sorted ions, while a mass spectrograph … Universalium
Mass spectrometry — (MS) is an analytical technique that measures the mass to charge ratio of charged particles.[1] It is used for determining masses of particles, for determining the elemental composition of a sample or molecule, and for elucidating the chemical… … Wikipedia
